Surface characterization on all types of materials, with 2 non-contact measurement stations (non destructive analysis)

High resolution and last-generation technical means.

Applications : surface characterization on all types of supports, tribology, coatings control, defects propagation (ex : cracks, scratches,…), surface planeness, manufacturing control, etc.

Roughness parameters control (Ra, RMS, P-V, etc.) on an optical glass :

Roughness parameters control on a glass mold

Cracks morphology control, on a folded aluminum plate

éprouvette fissurée

Micro-printing morphology on a mammary prosthesis

The data are numerically processed to obtain :
 Surface Roughness parameters control.
 a defect morphology
 the step height on a profile
 Surface state characterization
 Normalised 2D and 3D roughness parameters
 Lenght, height, angle and thickness measurements
 Volumic calculations (peak or valley)
 2d and 3d surface representation

2 complementary devices : , the OPTOSURF and the ALTISURF 500.

 OPTOSURF: 0,1nm < Ra < 1000nm
 ALTISURF 500 : 1000nm < Ra

Roughness parameters measurements on a profile or on a surface :

Sa : Arithmetic average of the height absolute value, inside a defined area

Sq : Quadratic average of the z values, inside a defined area