|Scanning Electron Microscopy & X-Rays Microanalysis
This equipment gives information about morphology and elemental composition of a solid sample in a very short time. The MEB-EDX is an essential tool to explore the microscopic world : high use convenience, all solid materials dedicated, wide depth of field…
It is made of two coupled equipments :
The SEM : Electron microscopy technique based on material-electron interaction principle, that can provide high-resolution pictures of a surface .
The X-Rays microanalysis : The EDX detector gets photons emitted by the material after the electron excitation, and ranks them in terms of increasing energy. Each energy value corresponds to a specific chemical element’s energy level, so elements contained in the material can be identified.
This technique simultaneously gives information about morphology (pictures) and chemistry (elemental composition).
Scanning Electron Microscope Low Vacuum HITACHI S3000N :
Magnification up to x100 000
Low vaccum mode ->No metallisation required for non-conductive materials
« Pelletier » cooling system : organic samples freezing to -30°C for a non-destructive observation
2 types of pictures : topographic (SE) or chemical (BSE) contrast.
Ultradry Silicon drift EDX detector, Thermo Electron :
Silicon crystal, NORVAR window
Detection from Be
Energy resolution : 132 eV mini on (Mn)
Volumic resolution : 1 µm3