Scanning Electron Microscopy & X-Rays Microanalysis
This equipment gives information about morphology and elemental composition of a solid sample in a very short time. The MEB-EDX is an essential tool to explore the microscopic world : high use convenience, all solid materials dedicated, wide depth of field…
It is made of two coupled equipments :
 The SEM : Electron microscopy technique based on material-electron interaction principle, that can provide high-resolution pictures of a surface .
The X-Rays microanalysis : The EDX detector gets photons emitted by the material after the electron excitation, and ranks them in terms of increasing energy. Each energy value corresponds to a specific chemical element’s energy level, so elements contained in the material can be identified.
This technique simultaneously gives information about morphology (pictures) and chemistry (elemental composition).
Equipment:
Scanning Electron Microscope Low Vacuum HITACHI S3000N :
Magnification up to x100 000
Low vaccum mode ->No metallisation required for non-conductive materials
« Pelletier » cooling system : organic samples freezing to -30°C for a non-destructive observation
2 types of pictures : topographic (SE) or chemical (BSE) contrast.
Ultradry Silicon drift EDX detector, Thermo Electron :
Silicon crystal, NORVAR window
Detection from Be
Energy resolution : 132 eV mini on (Mn)
Volumic resolution : 1 µm3 |
